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طیف سنج جرمی
Description Related item from Annex I to Regulation (EC) No 428/2009 II.A3.002 Mass spectrometers, other than those specified in 3A233 or 0B002.g, capable of measuring ions of 200 atomic mass units or more and having a resolution of better than 2 parts in 200, as follows, and ion sources thereof:
Inductively coupled plasma mass spectrometers (ICP/MS)
;Glow discharge mass spectrometers (GDMS)
;Thermal ionisation mass spectrometers (TIMS)
;Electron bombardment mass spectrometers which have a source chamber constructed from, lined with or plated with 'materials resistant to corrosion by uranium hexafluoride UF6'
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